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Search for "scanning transmission ion microscopy (STIM)" in Full Text gives 2 result(s) in Beilstein Journal of Nanotechnology.
Scanning transmission helium ion microscopy on carbon nanomembranes
Beilstein J. Nanotechnol. 2021, 12, 222–231, doi:10.3762/bjnano.12.18
- energy-filtered transmission electron microscopy measurements. Keywords: carbon nanomembranes; dark field; helium ion microscopy (HIM); scanning transmission ion microscopy (STIM); SRIM simulations; Introduction Throughout the past decade, the helium ion microscope (HIM) has emerged as a versatile
- -field scanning transmission ion microscopy (STIM) holder. The holder design is based on the concept of a SE conversion holder. The holder can easily be implemented into any existing HIM. It is mounted on the sample stage without modifications to the microscope. Carbon nanomembranes (CNMs) serve as test
- is evaluated and compared to Monte Carlo simulations. A comparison with established thickness measurements confirms the STIM results. Experimental A dark-field scanning transmission ion microscopy (STIM) holder was designed for a Zeiss Orion Plus helium ion microscope (HIM). All HIM and STIM
Scanning transmission imaging in the helium ion microscope using a microchannel plate with a delay line detector
Beilstein J. Nanotechnol. 2020, 11, 1854–1864, doi:10.3762/bjnano.11.167
- based on a microchannel plate with a delay line readout structure has been developed to perform scanning transmission ion microscopy (STIM) in the helium ion microscope (HIM). This system is an improvement over other existing approaches since it combines the information of the scanning beam position on
- work, we present a new system for comprehensive scanning transmission ion microscopy (STIM) analyses that gives more flexibility to the user than the earlier approaches. We adopted a microchannel plate (MCP) and a delay line readout structure as a position-sensitive detector to be used in the HIM. A
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